Instrumentations

(English/Japanese)

(1) Energy-filtering transmission electron microscope (JEM2010FEF)

Accelerating voltage : 20-200 kV Field-emission gun (schottky type) Omega-filter (energy dispersion : 1.1 micron/eV at 200 kV) Observable energy range : 0-2,000 eV Acceptance angle : 10 degree Point-resolution : 0.19 nm Minimum probe size : 0.5 nm diameter Specimen tilt angle : 20 degree X-ray analyzer : B-U Detection system : Imaging plate, CCD and film Active-mount devices to reduce vibrations are attached.

(2) Electron energy-loss spectroscopy microscope (JEM-HREA80)

Retarding type Wien-filters for the monochrometer and analyzer Field-emission gun (schottky type) Accelerating voltage : 40-60 kV Energy resolution : 12 meV - 0.3 eV Spatial resolution : 30-180nm Detection system : CCD To application data

(3) Transmission electron microscopes (JEM-2010)

Accelerating voltage : 20-200 kV Point-resolution : 0.23 nm X-ray analyzer : B-U Detection system : Imaging plate and film

(4) Workstations

• Opteron cluster system
  Opteron 146 (16 nodes + 1 host controller)
• Athlon X2 cluster system
  Athlon 64 X2 4800+ (16 nodes + 1 host controller)
• Xeon Workstation
  Xeon woodcrest (Dual core * Dual CPU)