High energy-resolution electron energy-loss spectroscopy microscope (JEM-HREA80)

Inelastically-scattered electrons contain fruitful information about the electronic structure of specimens. Valence-electron excitation spectra (lower than about 50 eV) give us dielectric functions of materials by using Kramers-Kronig analysis. Inner-shell-electron excitation spectra (higher than about 50 eV) present the partial density of states of conduction bands.

Electron energy-loss spectroscopy (EELS) based on transmission electron microscopy is the only way to characterize the electronic structure of identified nano-scale materials. Energy-resolutions of EELS using conventional transmission microscopes are usually about 1 eV. The value is not enough for critical studies of the electronic structure of nano-scale materials.

Our EELS microscope is equipped with specially-designed double-focus Wien filters as the monochromator and analyzer. The energy resolution of the EELS microscope is 12 meV-0.3 eV. The specimens are judged their quality by electron diffraction patterns and examined by high energy-resolution EELS.

hrea80 b k-edge spectra and calculated dos of alpha-boron
High energy-resolution electron
energy-loss spectroscopy
microscope (JEM-HREA80) 		Schematic picture
of ray-path 		B K-edge spectra and calculated
DOS of alpha-Boron
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