Prof. Dr. Masami Terauchi
E-mail: m_terauchi@tohoku.ac.jp
Tel: +81-(0)22-217-5372
Fax: +81-(0)22-217-5373
(Revised : 1 April, 2025)
What's New
- New scientific reports were published.
Research Themes
- Development and applications of EM-SXES method
- Developments and applications of TEM-EELS method
- Applications of TEM based methods: CBED, ED, HREM
TEM : Transmission electorn microscopy
SXES : Soft X-ray emission spectrosocpy
EELS: Electron energy-loss spectroscopy
ED : Electron diffraction
CBED: Convergent-beam electron diffraction
HREM: High-resolution electron microscopy
Research materials (present)
- Boron and related materials (collaboration with Prof. M.Takeda, Prof. K.Kozu, Prof. S.Okada)
- Carbon and related materials (collaboration with Prof. M.Aono)
- New inorganic materials (collaboration with Prof. T.Yamada and Prof. H.Morito)
Publications
Invited talks
Awards
- 2024- 日本分析化学会 先端分析技術賞 JAIMA機器開発賞
(Title: 軟X線ホログラフィック不等間隔溝回折格子の開発と高分解能発光分光システムへの応用)
- 2024- 日本ホウ素・ホウ化物研究会 学術賞
(Title: 分析電子顕微鏡を用いたホウ素・ホウ化物の電子状態解析)
- 2016- 平成28年度 科学技術分野の文部科学大臣表彰(科学技術賞 開発部門)
(Title: 電子顕微鏡用軟X線発光分析システムの開発育成)
- 2015- 第15回 山﨑貞一賞 (計測評価分野)
(Title: 電子顕微鏡用軟X線分光器の開発と実用化)
- 2015- Birks Award 2015 (Microanalysis Society)
(Title: Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM)
- 2015- The Japanese Society of Microscopy Award for the Scientific Paper in 2015
(Title: A new grating X-ray spectrometer for 2-4 keV enabling a separate observation
of In-Lβ and Sn-Lα emissions of indium-tin-oxide;
Masami Terauchi, et al., Microscopy, vol.62, 391-395 (2013).)
- 2009- The Japanese Society of Microscopy Award for the Scientific Paper in 2009
(Title: High energy-resolution electron energy-loss spectroscopy study of the electric structure of two-wall carbon nanotubes;
Yohie Sato, Masami Terauchi, Yahachi Saito and Riichiro Saito,
J. Electron Microscopy, vol.55, 137-142 (2006).)
- 2004- Macres Award 2004 (Microanalysis Society)
(Title: A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons)
- 2000- Prize of Electron Microscopy Sodiety of Japan (Setou prize)
(Title: Development of high energy-resolution EELS microscope and its applications to materials)
- 1995- Prize of Crystallographic Society of Japan
(Title: Developments and applications of CBED method and its extention to (3+1)-dimensional crystallography)
Recent constructions
New HR-SXES spectrometor / Latest my hobby constructions
- Recent Progresses in Soft X-ray Emission Spectroscopy Microscopy
IOP Conference Series: Materials Science and Engineering 891, 012022 (2020).
MCP+CMOS camera for our SEM-SXES instrument
- Chemical state information of bulk specimens obtained by SEM based soft-X-ray emission spectroscopy
Microscopy & Microanalysis, vol.20(3), 692-697 (2014).
Guzumania 2020 in my office / Paeonia 2023 in my garden / Orchid 2023 in my office
Gallery
Education
- 1984- B.Sc. in Physics, Tohoku University
(Thesis title; Study of the structural phase transformation of MoS2)
- 1986- M.Sc. in Physics, Tohoku University
(Thesis title; Develoments of large-angle convergent-beam electron diffraction methods)
- 1988- Ph.D. in Physics, Tohoku University
(Thesis title; Studies of several materials which undergo structural phase transformations and quasicrystals by convergent-beam electron diffraction)
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