Activities in 2006

1. Original Papers and Reviews

1a. Original Papers

  1. Electronic structure analyses of BN network materials using high energy-resolution spectroscopy methods based on transmission electron microscopy (invited paper)
    Masami Terauchi
    Microscopy Research and Technique, 69, 531-537 (2006)
  2. Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1\102) substrate using convergent-beam electron diffraction
    Takayuki Akaogi, Kenji Tsuda, Masami Terauchi and Michiyoshi Tanaka
    J. Electron Microscopy,.55(3), 129-135 (2006)
  3. High energy-resolution electron energy-loss spectroscopy study of the electric structure of double-walled carbon nanotubes
    Yohei Sato, Masami Terauchi, Yahachi Saito and Riichiro Saito
    J. Electron Microscopy, 55(3), 137-142 (2006)
  4. Soft-X-ray emission spectroscopy based on TEM -Toward a total electronic structure analysis-
    Masami Terauchi and Masanao Kawana
    Ultramicroscopy,106(11-12), 1069-1075 (2006)

1b. Awards

2. Conferences

2a. International conferences

  1. Structure and electronic properties of Mg-doped b-rhombohedral boron constructed from icosahedral clusters
    H.Hyodo, S.Araake, K.Soga, Y.Satoh, M.Terauchi, K.Kimura
    International Symposium on Anomalous Quantum Materials2006, Japan, okinawa,(2006.6)
  2. Microstructures of Al-Cu-Fe quasicrystalline catalysts prepared by NaOH aq. Leaching
    T.Tanabe, S.Kameoka, F.Sato, M.Terauchi, A.P.Tsai
    5th Tokyo Conf. on Advanced Catalytic Science and Technology, Japan, Tokyo,(2006.7)
  3. Monochromator for a 200kV Analytical Electron Microscope
    M.Mukai, W.Inami, K.Omoto, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, M.Naruse, T.Honda and M.Tanaka
    Microscopy & Microanalysis2006, USA, CHICAGO,(2006.7.31-8.3)
  4. Development of wavelength-dispersive X-ray spectrometer for a conventional analytical transmission electron microscope
    M.Terauchi, M.Loike, K.Fukushima and J.Kimura
    Microscopy & Microanalysis2006, USA, CHICAGO,(2006.7.31-8.3)
  5. Monochromator for a 200kV Analytical Electron Microscope
    M.Mukai, W.Inami, K.Omoto, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, M.Naruse, T.Honda and M.Tanaka
    The 16th International Microscopy Congress(IMC16), Japan, Sapporo(2006.9)
  6. Development of wavelength-dispersive X-ray spectrometer for a conventional analytical transmission electron microscope
    M.Terauchi, M.Loike, K.Fukushima and J.Kimura
    The 16th International Microscopy Congress(IMC16), Japan, Sapporo(2006.9)
  7. Local lattice parameter detedmination of silicon (001) layer grown on a sapphire (1102) substrate usuing convergent-beam electron diffraction
    T.Akaogi, K.Tsuda, M.Terauchi and M.Tanaka
    The 16th International Microscopy Congress(IMC16), Japan, Sapporo(2006.9)
  8. High energy-resolution electron energy-loss spectroscopy study of the electric structure of carbon nanotubes
    Y. Satoh, M. Terauchi, Y. Saito and R. Saito
    The 16th International Microscopy Congress(IMC16), Japan, Sapporo(2006.9)
  9. Electrostatic potential and electron density analysis of the ferroelectric phase of BaTiO3 using convergent-beam electron diffraction(invited)
    Kenji Tsuda and Michiyoshi Tanaka
    The 16th International Microscopy Congress(IMC16), Japan, Sapporo(2006.9)
  10. Space Group Determinations of LaGa1-xMgxO3-x/2 using Convergent-Beam Electron Diffraction
    Yoichiro Ogata, Kenji Tsuda, Takuya Hashimoto
    The 16th International Microscopy Congress(IMC16), Japan, Sapporo(2006.9)
  11. Charge Density Analysis of Silicon using Convergent-Beam Electron Diffraction
    Yoichiro Ogata, Kenji Tsuda and Michiyoshi Tanaka
    The 16th International Microscopy Congress(IMC16), Japan, Sapporo(2006.9)
  12. Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction(invited)
    K. Tsuda
    the 8th Taiwan-Japan Joint Seminar on Crystallography, Yilan, Taiwan(2006,9)
  13. Recent advances in spectroscopy methods based on TEM (invited)
    M.Terauchi
    10th SANKEN International Symposium on Nanoscience and Nanotechnology Osaka,(2006.9)
  14. TEM-EELS study of electronic structures of quasicrystals and apprpximants
    M.Terauchi, Y.Uemichi, A.P.Tsai, T.Takeuchi and U.Mizutani
    A periodic 2006, Japan, Miyagizao(2006.9)
  15. Cross-section TEM investigation of quasicrystalline catalysts prepared by NaOH aq.leaching
    Toyokazu Tanabe, Satoshi Kameoka, Futami Sato, Masami Terauchi, An Pang Tsai
    A periodic 2006, Japan, Miyagizao(2006.9)

2b. Conference proceedings

  1. Silicon and boron carbonitride films obtained by CVD methods
    N.I.Fainer, M.L.Kosinova, V.S.Sulyaeva, Yu.M.Rumyantsev, E.A.Mavimovskii, B.M.Ayupov, B.A.Kolesov, F.A.Kuznetsov, V.G.Kesler, M.Terauchi, K.Shibata, F.Satoh,Z.X.Cao
    Proceedings of 5th Israeli-Russian bi-national workshop (Novosibrisk),47-66 (2006.7)
  2. Recent advances in spectroscopy methods based on TEM (invited)
    M.Terauchi
    Proceedings of 10th SANKEN International Symposium on Nanoscience and Nanotechnology Osaka,(2006.9)
  3. TEM-EELS study of electronic structures of quasicrystals and apprpximants
    M.Terauchi, Y.Uemichi, A.P.Tsai, T.Takeuchi and U.Mizutani
    Abstract of A periodic 2006, Japan, Miyagizao(2006.9)
  4. Cross-section TEM investigation of quasicrystalline catalysts prepared by NaOH aq.leaching
    Toyokazu Tanabe, Satoshi Kameoka, Futami Sato, Masami Terauchi, An Pang Tsai
    Abstract of A periodic 2006, Japan, Miyagizao(2006.9)