Activities in 2004

1. Original Papers and Reviews

1a. Original Papers

  1. Refinement of the crystal structural parameters of the intermediate phase of h-BaTiO3using convergent-beam electron diffraction
    Y. Ogata, K. Tsuda, Y. Akishige,M. Tanaka
    Acta Cryst. ,A60(6),525-531(2004)
  2. Investigation of the Structure of Single Crystal Sr3Ru2O7 by Neutron and Convergent Beam Electron Diffractions
    Ryoji Kiyanagi, Kenji Tsuda, Naofumi Aso, Hiroyuki Kimura, Yukio Noda, Yoshiyuki Yoshida, Sin-Ichi Ikeda,Yoshiya Uwatoko
    J. Phys. Soc. Jpn.,73(3),639-642(2004)
  3. The structural and electric properties of the perovskite system BaTiO3-Ba(Fe1/2Ta1/2)O3
    G.Li, S.Liu, F.Liao, S.Tian, X.Jing, J.Lin, Y.Uesu, K.Kohn, K.Saitoh, M.Terauchi, N.Di,Z.Cheng
    J. Solid State Chem,177,1695-1703(2004)
  4. High energy-resolution electron energy-loss spectroscopy study of the electronic structure of Cu- and Mg-Si-doped b-rhombohedral boron crystals
    Masami Terauchi, Yohei Sato, Takahiro Nakayama, Atsushi Oguri,Kaoru Kimura
    J. Solid State Chem.,177,2916-2919(2004)
  5. Li- and Mg-doping into Icosahedral Boron Crystals, a- and b-Rhombohedral Boron, Targeting High Temperature Superconductivity: Structure and Electronic States
    Kohei Soga, Atsushi Oguri, Satoshi Araake, Masami Terauchi, Akihiko Fujiwara,Kaoru Kimura
    J. Solid State Chem.,177,498-506(2004)
  6. Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED
    Takayuki Akaogi, Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka
    Journal of Electron Microscopy,53(1),11-19(2004)
  7. Metal transition of ƒ¿-rhombohedral Boron by Li- and Mg-dopings observed by high energy-resolution electron energy-loss spectroscopy
    M.Terauchi, A.Oguri, K.Kimura and A.Fujiwara
    J. Electron Microscopy, 53(6), 589-592 (2004)
  8. Lattice parameter determination of a composition controlled Si1-xGex layer on a Si (001) substrate using convergent-beam electron diffraction
    T.Akaogi, K.Tsuda, M.Terauchi and M.Tanaka
    J. Electron Microscopy, 53(6), 593-600 (2004)

1b. Reviews

1c. Books and articles

  1. Encyclopedia of Science on Form(2004)
    Kenji Tsuda, Akira Saito, Masami Terauchi, Michiyoshi Tanaka

1d. Awards

  1. Seto Prize
    Kenji Tsuda
    The Japanese Society of Microscopy(2004.6.9)
  2. Microbeam Analysis Society 2004 Macres Award for Best Instrumentation Paper (38th Annual Meeting)
    M. Terauchi
    Microbeam Analysis Society(2004)

2. Conferences

2a. International conferences

  1. Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction (invited)
    Kenji Tsuda, Yoichiro Ogata, Michiyoshi Tanaka
    8th Australian Conference of Microscopy and Microanalysis,Australia,Geelong,(2004.2)
  2. Test results of MIRAI-21 analytical electron microscope
    M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, D. Ioanoviciu, G. Martinez, M. Naruse, T. Honda and M. Tanaka
    8th Asia-Pacific conference on electron microscopy,Japan,Kanazawa,(2004.6)
  3. High energy-resolution electron energy-loss spectroscopy study of the electronic structure of two-wall carbon nanotubes
    Y. Sato, M. Terauchi, Y. Saito and R. Saito
    8th Asia-Pacific conference on electron microscopy,Japan,Kanazawa,(2004.6)
  4. Development of a wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate the density of states of the valence band (invited)
    M. Terauchi
    8th Asia-Pacific conference on electron microscopy,Japan,Kanazawa,(2004.6)
  5. Lattice parameter determination of a composition controlled Si1-xGex layer on a Si (001) substrate using a CBED
    T. Akaogi, K. Tsuda, M. Terauchi and M. Tanaka
    8th Asia-Pacific conference on electron microscopy,Japan,Kanazawa,(2004.6)
  6. Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction (invited)
    Kenji Tsuda, Yoichiro Ogata, Michiyoshi Tanaka
    8th Asia-Pacific conference on electron microscopy,Japan,Kanazawa,(2004.6)
  7. A CBED technique for observation of polarity (invited)
    M. Terauchi
    2nd German-Japanese school on CBED,Geaman,TU-Ilmenau,(2004.6)
  8. Detection of the As-doped region in silicon by convergent-beam electron diffraction (invited)
    M. Terauchi, H. Mitsuishi, K. Tsuda and K. Kawamura
    2nd German-Japanese school on CBED,Geaman,TU-Ilmenau,(2004.6)
  9. CBED refinement of crystal structure and charge density
    K. Tsuda
    2nd German-Japanese school on CBED,Geaman,TU-Ilmenau,(2004.6)
  10. Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction (invited)
    Kenji Tsuda, Yoichiro Ogata ,Michiyoshi Tanaka
    Gordon Research Conference "Electron Distribution and Chemical Bonding",USA,South Hadley,(2004.7)
  11. Preparation of a novel copper catalyst from Al-Cu-Fe quasicrystalline
    S. Kameoka, T. Tanabe, M. Terauchi, A. P. Tsai
    13th International Congress on Catalysis ,France,Paris,(2004.7)
  12. Local lattice parameter determination of strained area of semiconductors using CBED
    T. Akaogi, K. Tsuda, M. Terauchi and M. Tanaka,
    Microscopy & Microanalysis 2004, USA, (2004.8)
  13. Detection of characteristic signals from As-doped (less than 1 at.%) regions of silicon by transmission electron microscopy and convergent-beam electron diffraction
    M. Terauchi, K. Tsuda, H. Mitsuishi and K. Kawamura
    Microscopy & Microanalysis 2004, USA, (2004.8)
  14. Performance of MIRAI-21 analytical electron microscope
    M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, D. Ioanoviciu, G. Martinez, M. Naruse, T. Honda and M. Tanaka
    Microscopy & Microanalysis 2004, USA, (2004.8)
  15. A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons (invited)
    M. Terauchi
    Microscopy & Microanalysis 2004, USA, (2004.8)

2b. Conference proceedings

  1. Test results of MIRAI-21 analytical electron microscope
    M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, D. Ioanoviciu, G. Martinez, M. Naruse, T. Honda, M. Tanaka
    Proc. of 8th Asia-Pacific conference on electron microscopy,117-118(2004)
  2. High energy-resolution electron energy-loss spectroscopy study of the electronic structure of two-wall carbon nanotubes
    Y. Sato, M. Terauchi, Y. Saito,R. Saito
    Proc. of 8th Asia-Pacific conference on electron microscopy,150-151(2004)
  3. Development of a wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate the density of states of the valence band (invited)
    M. Terauchi
    Proc. of 8th Asia-Pacific conference on electron microscopy,159-160(2004)
  4. Lattice parameter determination of a composition controlled Si1-xGex layer on a Si (001) substrate using a CBED
    T. Akaogi, K. Tsuda, M. Terauchi, M. Tanaka
    Proc. of 8th Asia-Pacific conference on electron microscopy,150-151(2004)
  5. Preparation of a novel copper catalyst from Al-Cu-Fe quasicrystalline
    S. Kameoka, T. Tanabe, M. Terauchi, A.P. Tsai
    Abstract of 13th International Congress on Catalysis, 1-276, (2004)
  6. A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons (invited)
    M. Terauchi
    Microscopy & Microanalysis,10(2), 1044-1045(2004)
  7. Local lattice parameter determination of strained area of semiconductors using CBED
    T. Akaogi, K. Tsuda, M. Terauchi, M. Tanaka
    Microscopy & Microanalysis,10(2), 310-311(2004)
  8. Detection of characteristic signals from As-doped (less than 1 at.%) regions of silicon by transmission electron microscopy and convergent-beam electron diffraction
    M. Terauchi, K. Tsuda, H. Mitsuishi, K. Kawamura
    Microscopy & Microanalysis,10(2), 338-339(2004)
  9. Performance of MIRAI-21 analytical electron microscope
    M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, D. Ioanoviciu, G. Martinez, M. Naruse, T. Honda, M. Tanaka
    Microscopy & Microanalysis,10(2), 858-859(2004)
  10. Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction
    K. Tsuda, Y. Ogata and M. Tanaka
    Abstract of the 18th Australian conference on microscopy and microanalysis, 85 (2004)
  11. Refinement of crystal structural parameters and charge density using convergent-beam electron diffraction
    K. Tsuda, Y. Ogata and M. Tanaka
    Proceedings of 8th Asia-Pacific conference on electron microscopy,30-31(2004)