Proceedings & Abstracts

Back to the main page

1986-1989, 1990-1992, 1993-1995, 1996-1998, 1999-2001, 2002-2004, 2005-2007, 2008-2010, 2011-2013, 2014-2016 2017-2019 2020-2022 2023-2025

    1986-1989
  1. Convergent- and Small-Area-Parallel-Beam Electron Diffraction of Icosahedral Quasicrystals
    M.Tanaka, M.Terauchi, K.Hiraga and M.Hirabayashi
    Proc. XIth Int. Cong. on Electron Microscopy (Kyoto, 8/31-9/7), vol.I, 171-172 (1986).

  2. Simultaneous Observation of Zone-Axis Pattern and }G Dark-Field Patterns in CBED
    M.Terauchi and M.Tanaka
    Proc. XIth Int. Cong. on Electron Microscopy (Kyoto, 8/31-9/7), vol.I, 693-694 (1986).

    1990-1992
  3. A WIEN FILTER ENERGY LOSS SPECTROMETER FOR TRANSMISSION ELECTRON MICROSCOPY
    K.Tsuno, J.Ohyama, M.Kato, J.Kimura, M.Kai, K.Nakanishi, M.Terauchi and M.Tanaka
    Proc. XIIth Int. Cong. for Electron Microscopy (Seattle, 8/12-18), vol.II, 32-33 (1990).

  4. PERFORMANCE OF A WIEN-FILTER ENERGY ANALYZER INSTALLED IN A TEM FOR EELS
    M.Terauchi, R.Kuzuo, F.Satou, M.Tanaka, K.Tsuno and J.Ohyama
    Proc. XIIth Int. Cong. for Electron Microscopy (Seattle, 8/12-18), vol.II, 88-89 (1990).

  5. MICROSCOPIC DETERMINATION OF STRESS DISTRIBUTION IN GaAs GROWN AT LOW TEMPERATURE ON GaAs(100)
    Z.L.Weber, A.Ishikawa, M.Terauchi and M.Tanaka
    Mat. Res. Soc. Symp. Proc., vol.208, 183-188 (1991).

  6. Electron Microscopy, Electron Energy Loss and X-Ray Emission Spectroscopy of Solid C60 and C70
    Y.Saito, N.Suzuki, M.Terauchi, R.Kuzuo, M.Tanaka, H.Shinohara, A.Ohshita, M.Ohkohchi and Y.Ando
    Proc. Int. Symp. on the Phys. and Chem. of Finit Systems (Richmond), vol.II, 1365-1370 (1991).

  7. PERFORMANCE OF A NEW HIGH-RESOLUTION ENERGY LOSS SPECTROSCOPY MICROSCOPE
    M.Terauchi, R.Kuzuo, M.Tanaka, K.Tsuno and J.Ohyama
    Proc. IVth Int. Symp. on Advanced Nuclear Energy Reserach (Mito, 2/5-7), 334-337 (1992).

  8. DETERMINATION OF THE DISPLACEMENT VECTOR AT A STACKING FAULT USING CONVERGENT-BEAM ELECTRON DIFFRACTION
    M.Tanaka, S,Yamada and M.Terauchi
    Proc. 5th Asia-Pacific Electron Microsc. Conf. (Beijing), 154-155 (1992).

  9. A NEW HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY MICROSCOPE
    M.Tanaka, M.Terauchi, R.Kuzuo, K.Tsuno, J.Ohyama and Y.Harada
    Proc. 50th Annual Meeting of EMSA (Boston), 940-941 (1992).

  10. LATTICE DEFECT IDENTIFICATION USING CONVERGENT-BEAM ELECTRON DIFFRACTION
    M.Tanaka, M.Terauchi and T.Kaneyama
    Proc. 50th Annual Meeting of EMSA (Boston), 1180-1181 (1992).

  11. APPLICATION OF CONVERGENT BEAM ILLUMINATION METHODS TO THE STUDY OF LATTICE DISTORTION ACROSS THE INTERFACE
    Z.L.Weber, T.Kaneyama, M.Terauchi and M.Tanaka
    Proc. 50th Annual Meeting of EMSA (Boston), 232-233 (1992).

  12. HIGH-RESOLUTION EELS STUDY OF THE ELECTRONIC STRUCTURE OF SEMICONDUCTORS CONTAINING LATTICE DEFECTS
    M.Terauchi and M.Tanaka
    Abstract of AsCA'92 (Singapore, 11/13-16), 15A-4 (1992).

  13. EELS STUDY OF THE TEMPERATURE DEPENDENCE OF THE VOLUME-PLASMON ENERGY IN ALUMINUM
    M.Terauchi, H.Abe, R.Kuzuo and M.Tanaka
    Abstract of AsCA'92 (Singapore, 11/13-16), 14S-34 (1992).

    1993-1995
  14. COHERENT CONVERGENT-BEAM ELECTRON DIFFRACTION
    M.Terauchi, K.Tsuda, M.Tanaka, T.Kaneyama and T.Honda
    Abstract of IUCr XVI (Beijing, 8/21-29), MS-13.01.05 (1993).

  15. HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTRA OF SOLID C60, C70 AND CARBON NANOTUBES
    R.Kuzuo, M.Terauchi, M.Tanaka, Y.Saito and H.Shinohara
    Abstract of IUMRS-ICAM-93 (Tokyo), M4-1 (1993).

  16. Observation of coherent CBED patterns
    K.Tsuda, M.Terauchi, M.Tanaka, T.Kaneyama and T.Honda
    Proc. 13rd Int. Cong. Electron Microscopy (Paris, 7/17-22), vol.1, 865-866 (1994).

  17. High-resolution Electron Energy-loss Study of Solid C60, C70, C84 and Carbon Nanotubes
    M.Terauchi, R.Kuzuo and M.Tanaka
    Proc. 13rd Int. Cong. Electron Microscopy (Paris, 7/17-22), vol.2A, 333-334 (1994).

  18. Line Defect Configuration Incorporated with Self-Interstitials in Si: A Combined Study by HREM, EELS and Electronic Caluculation
    S.Takeda, M.Terauchi, M.Tanaka and M.Kohyama
    Proc. 13rd Int. Cong. Electron Microscopy (Paris, 7/17-22), vol.2A, 567-568 (1994).

  19. High-resolution Electron Energy-loss Study of Solid C60, C70, C84 and Carbon Nanotubes
    M.Terauchi, R.Kuzuo and M.Tanaka
    Abstract of EELSI94 (Leukerbad,Switzerland, 7/24-28), 89 (1994).

    1996-1998
  20. Electron energy-loss spectroscopy study of the electronic structure of α-rhombohedral boron
    M.Terauchi, Y.Kawamata, M.Tanaka, M.Takeda and K.Kimura
    Abstract of 12th International Symposium on Boron, Borides and Related Compounds (Austria), (1996).

  21. EELS study of the electronic structure of Li- and V-doped β-rhombohedral boron
    M.Terauchi, Y.Kawamata, M.Tanaka, H.Matsuda and K.Kimura
    Abstract of 12th International Symposium on Boron, Borides and Related Compounds (Austria), (1996).

  22. Simulation of electron trajectories of Wien filters for EELS installed in TEM
    K.Tsuno, Y.Ishida, M.Terauchi and M.Tanaka
    Proc. 11th European Congress on Electron Microscopy (Dablin,Ireland), (1996).

  23. High-resolution EELS study of carbon and boron allotropes (invited)
    M.Tanaka and M.Terauchi
    Abstract of 2nd International Symposium on Advanced Physical Fields: Characterization of Nanostructures (Tsukuba, 2/19-21), O-13 (1997).

  24. Electron Energy-Loss Spectroscopy of the Electronic Structure of Quasicrystals
    M.Terauchi, H. Ueda, M.Tanaka, A.P.Tsai, A.Inoue and T.Masumoto
    Abstract of 6th Int. Conf. on Quasicrystals (Tokyo, 5/26-30), 103 (1997).

  25. Metallic-covalent bonding conversion in aluminum-based and boron-based icosahedral cluster solids
    K.Kimura, H,Matsuda, M.Fujimori, M.Terauchi, M.Tanaka, H.Kumigashira, N.Yokoya and T.Takahashi
    Abstract of 6th Int. Conf. on Quasicrystals (Tokyo, 5/26-30), 105 (1997).

  26. Noncentrosymmetric decagonal quasicrystals (invited)
    K.Tsuda, K.Saitoh, M.Terauchi, M.Tanaka, A.P.Tsai, A.Inoue and T.Masumoto
    Abstruct of International Conference on Aperiodic Crystals (France), (1997).

  27. A New Ω-filter Electron Microscope and a High-resolution Electron Energy-Loss Spectroscopy Microscope (invited)
    M.Tanaka, M.Terauchi, K.Tsuda, T.Kaneyama, K.Tsuno, T.Honda, M.Ishida and Y.Harada
    Proc. of 7th International Beijing Conference and Exhibition on Instrumental Analysis (China, 10/14-17), vol.A, 5-6 (1997).

  28. High energy-resolution electron energy-loss spectroscopy microscope (invited)
    M.Terauchi and M.Tanaka
    Abstruct of 7th conference on Frontiers of Electron Microscopy in Materials Science (Germany, 4/19-24), (1998).

  29. Construction and preliminary test of a new energy filtering TEM "JEM-2010FEF"
    T.Kaneyama, K.Tsuno, T.Honda, M.Kersker, K.Tsuda, M.Terauchi and M.Tanaka
    14th Int. Cong. Electron Microscopy (Mexico, 8/30-9/4), Vol.I, 125-126 (1998).

  30. Performance of a new Ω-filter electron microscope on convergent-beam electron diffraction
    K.Tsuda, K.Saito, M.Terauchi, M.Tanaka, T.Kaneyama, K.Tsuno and T.Honda
    Proc. 14th Int. Cong. Electron Microscopy (Mexico, 8/30-9/4), Vol.I, 251-252 (1998).

  31. Design of an Omega filter for 200kV TEM
    K.Tsuno, T.Kaneyama, H.Honda, Y.Ishida, K.Tsuda, M.Terauchi and M.Tanaka
    Proc. 14th Int. Cong. Electron Microscopy (Mexico, 8/30-9/4), Vol.I, 253-254 (1998).

  32. High energy-resolution EELS study of the electronic structure of boron-nitride nanotubes
    M.Terauchi, M.Tanaka, T.Matsumoto and Y.Saito
    Proc. 14th Int. Cong. Electron Microscopy (Mexico, 8/30-9/4), Vol.III, 125-126 (1998).

  33. Electron energy-loss spectroscopy study of vanadium oxides
    H.Abe, M.Terauchi, M.Tanaka, S.Shin and Y.Ueda
    Proc. 14th Int. Cong. Electron Microscopy (Mexico, 8/30-9/4), Vol.III, 631-632 (1998).

  34. High energy-resolution EELS study of the electronic structure of B12 cluster materials
    M.Terauchi, M.Tanaka and K.Kimura
    Abstracts of "Towards Atomic Resolution Analysis" (Seattle, 9/6-11), 21 (1998).

  35. High resolution electron energy-loss spectroscopy study of TiO2 polymorphs
    H.Abe, M.Terauchi and M.Tanaka
    Abstracts of "Towards Atomic Resolution Analysis" (Seattle, 9/6-11), 34 (1998).

    1999-2001
  36. Electron energy-loss spectroscopy study of the electronic structure of boron-nitride nanotubes (invited)
    M.Terauchi, M.Tanaka and Y.Saito
    Proc. 6th NIRIM International Symposium on Advanced Materials (Tsukuba, 2/28-3/3), 49-50 (1999).

  37. Electron Energy-Loss Spectroscopy Study of the phase transition of amorphous, quasicrystalline and crystalline Al75Cu15V10 alloys
    M.Terauchi, H.Ueda, M.Tanaka, A.P.Tsai, A.Inoue and T.Masumoto
    7th International Conference on Quasicrystals (Stattgart, 9/20-24), 16 (1999).

  38. High energy-resolution EELS microscope and its application (invited)
    M.Terauchi and M.Tanaka
    Proc. 6th NIRIM International Symposium on Advanced Materials (Hayama, 2/29-3/3), 17-18 (2000).

  39. High energy-resolution electron energy-loss spectroscopy based on electron microscopy (invited)
    M.Terauchi and M.Tanaka
    Proc. 2nd IUMAS (Inst. Phys. Conf. Ser. No.165), 211-212 (2000).

  40. An 0.2eV energy resolutio analytical electron microscope
    M.Tanaka, M.Terauchi, K.Tsuda, K.Saitoh, T.Honda, K.Tsuno, M.Naruse, T.Tomita and T.Kaneyama
    Proc. 2nd IUMAS (Inst. Phys. Conf. Ser. No.165), 217-218 (2000).

  41. Advances in symmetry analysis by convergent-beam electron diffraction (invited)
    M.Terauchi and M.Tanaka
    Proc. 2nd IUMAS (Inst. Phys. Conf. Ser. No.165), 201-202 (2000).

  42. Synthesis and Properties of Boron Carbonitride and Boron Nitride films
    M.L.Kosinova, N.I.Fainer, E.A.Maximovski, Yu.M.Rumyantsev, M.Terauchi, K.Shibata, F.Satoh, M.Tanaka and F.A.Kuznetsov
    Abstract of the 1st Asian Conference on Crystal Growth and Crystal Technology (Sendai, 8/29-9/1), (2000).

  43. Films of Individual and Mixed Sulphides of Cadmium, Copper and Zinc
    N.I.Fainer, Yu.M.Rumyantsev, M.L.Kosinova, M.Terauchi, K.Shibata, F.Satoh, M.Tanaka and F.A.Kuznetsov
    Abstract of the 1st Asian Conference on Crystal Growth and Crystal Technology (Sendai, 8/29-9/1), (2000).

  44. Synthesis and Properties of Silicon Carbonitride
    N.I.Fainer, M.L.Kosinova, Yu.M.Rumyantsev, M.Terauchi, K.Shibata, F.Satoh, M.Tanaka and F.A.Kuznetsov
    Abstract of the 1st Asian Conference on Crystal Growth and Crystal Technology (Sendai, 8/29-9/1), (2000).

  45. An new 0.2eV energy resolution JEOL electron microscope (invited)
    M.Tanaka, M.Terauchi, K.Tsuda, K.Saitoh, T.Honda, K.Tsuno, M.Naruse, T.Tomita and T.Kaneyama
    Abstract of the Joint meeting 2000 of JEM-users (Germany, 9/25-26), (2000).

  46. High energy-resolution EELS and X-ray spectroscopy (invited)
    M.Terauchi and M.Tanaka
    Abstract of 8th conference on Frontiers of Electron Microscopy in Materials Science (Matsue, 11/13-17), 77 (2000).

  47. High Energy-Resolution EELS Study of the Electronic Structure of Polymerized C60 Single Crystals
    M.Terauchi, S.Nishimura, M.Tanaka, T.Mitani, Y.Iwasa and T.Yagi
    Abstract of International Symposium on Nanonetwork Materials (Kamakura, 1/15-18), 115 (2001).

  48. Superconductivity in Li-doped α-rhombohedral Boron
    A.Oguri, K.Kimura, M.Terauchi and M.Tanaka
    Abstract of International Symposium on Nanonetwork Materials (Kamakura, 1/15-18), 122 (2001).

  49. High Energy-Resolution EELS Study of the Electronic Structure of Boron Nitride Cones
    M.Terauchi, M.Kawana, M.Tanaka, K.Suzuki, A.Ogino and K.Kimura
    Abstract of International Symposium on Nanonetwork Materials (Kamakura, 1/15-18), 133 (2001).

  50. A sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope to obtain the density of states of the valence band (invited)
    M.Terauchi, H.Yamamoto and M.Tanaka
    Microscopy & Microanalysis, vol.7(supple.2) (USA, 8/5-9), 228-229 (2001).

    2002-2004
  51. Development of a high energy-resolution soft-X-ray spectrometer for a transmission electron microscope (invited)
    M.Terauchi
    Abstract of Strategies and Advances in Atomic Level Spectroscopy and Analysis Workshop (Guadeloupe, 5/5-9), 30 (2002).

  52. Physical properties and superconductivity in Li- and Mg-doped α- and β-rhombohedral boron
    A.Oguri, H.Yahata, K.Soga, K.Kimura, M.Terauchi and A.Fujiwara
    Abstract of 14th International symposium boron, borides and related compounds (Russia, 6/9-14), (2002).

  53. Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope
    M.Terauchi and M.Kawana
    Microscopy & Microanalysis, vol.8(supple.2) (Quebec, 8/4-8), 644-645 (2002).

  54. Development of An 0.2eV Energy Resolution Analytical Electron Microscope (invited)
    M.Tanaka, M.Terauchi, K.Tsuda, K.Saitoh, M.Mukai, T.Kaneyama, T.Tomita, K.Tsuno, M.Kersker, M.Naruse, and T.Honda
    Microscopy & Microanalysis, vol.8(supple.2) (Quebec, 8/4-8), 66-67 (2002).

  55. Detection of the arsenic-doped region in silicon by convergent-beam electron diffraction
    M.Terauchi and K.Kawamura
    Abstract of IUCr XIX(Geneva, 8/6-15), MS19.01 (2002).

  56. Synthesis of gradient nanocrystalline layers on the basis of carbonitride boron
    M.L.Kosinova, Yu.M.Rumyantsev, N.I.Fainer, E.A.Maximovskii, K.G.Myakishev, I.P.Dolgovesova, B.M.Ayupov, B.A.Kolesov, M.Terauchi, K.Shibata, F.Satoh and M.Tanaka
    Abstract of VI Bilateral Russian-German Symposium gPhysics and Chemistry of advanced materials h(Novosibirsk, 8/18-27), P3.13, (2002).

  57. gMIRAI-21 h ANALYTICAL ELECTRON MICROSCOPE - PERFORMANCE OF THE MONOCHROMATOR -
    M.Mukai, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, K.Saitoh, M.Kersker, M.Naruse, T.Honda and M.Tanaka
    Proc. 15th Int. Cong. Electron Microscopy (Durban, South Africa, 9/1-6), (2002).

  58. High energy-resolution EELS and XES analysis of BN materials (invited)
    M.Terauchi
    Proc. of 10th International Symposium on Advanced Materials (Tsukuba, 3/10-13), 43-44 (2003).

  59. Control of crystal polarity of GaN epilayers grown on ZnO templates
    T.Suzuki, J.-J.Kim, A.Setiawan, H.-J.Ko, K.Saitoh, M.Terauchi and T.Yao
    Abstract of 1st Int. Symp. on Point defect and Nonstoichiometry (Sendai, 3/20-22), FP-35 (2003).

  60. Growth of Homogeneous and Gradient BCxNy Films by PECVD Using Trimethylamino Borane Complex
    M.Kosinova, N.Fainer, Y.Rumyantsev, E.Maximovski, F.Kuznetsov, M.Terauchi, K.Shibata and F.Satoh
    Electrochemical Society Proceedings (Paris, 4/27-5/2), vol.2003-08, 708-715 (2003).

  61. Nanocrystalline SiCxNy Films: RPECVD Synthesis and Transformation Under Thermal Annealing
    N.Fainer, M.Kosinova, Y.Rumyantsev, B.Ayupov, B.Kolesov, F.Kuznetsov, A.Boronin, S.Koscheev, M.Terauchi, K.Shibata and F.Satoh
    Electrochemical Society Proceedings (Paris, 4/27-5/2), vol.2003-08, 1086-1093 (2003).

  62. A New High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope
    M.Terauchi and M.Koike
    Microscopy & Microanalysis, vol.9(supple.2) (USA, 8/4-8), 894-895 (2003).

  63. gMIRAI-21 h ANALYTICAL ELECTRON MICROSCOPE - PERFORMANCE OF THE MONOCHROMATOR -
    M.Mukai, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, K.Saitoh, M.Naruse, T.Honda and M.Tanaka
    Microscopy & Microanalysis, vol.9(supple.2) (USA, 8/4-8), 954-955 (2003).

  64. A new method to characterize dopant profiles in NMOS-FETs using conventional transmission electron microscopy
    K.Kawamura, K.Ikeda and M.Terauchi
    Proc. of 7th Int. Conf. on Atomically controlled surfaces, Interfaces and Nanostructures (Nara, 11/16-20), (2003).

  65. Test results of MIRAI-21 analytical electron microscope
    M.Mukai, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, D.Ioanoviciu, G.Martinez, M.Naruse, T.Honda and M.Tanaka
    Proc. of 8th Asia-Pacific conference on electron microscopy (Kanazawa, 6/9-11), 117-118 (2004).

  66. High energy-resolution electron energy-loss spectroscopy study of the electronic structure of two-wall carbon nanotubes
    Y.Sato, M.Terauchi, Y.Saito and R.Saito
    Proc. of 8th Asia-Pacific conference on electron microscopy (Kanazawa, 6/9-11), 150-151 (2004).

  67. Development of a wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate the density of states of the valence band (invited)
    M.Terauchi
    Proc. of 8th Asia-Pacific conference on electron microscopy (Kanazawa, 6/9-11), 159-160 (2004).

  68. Lattice parameter determination of a composition controlled Si1-xGex layer on a Si (001) substrate using a CBED
    T.Akaogi, K.Tsuda, M.Terauchi and M.Tanaka
    Proc. of 8th Asia-Pacific conference on electron microscopy (Kanazawa, 6/9-11), 499-500 (2004).

  69. Preparation of a novel copper catalyst from Al-Cu-Fe quasicrystalline
    S.Kameoka, T.Tanabe, M.Terauchi and A.P.Tsai
    Abstract of 13th International Congress on Catalysis (Paris, 7/11-16), P1-276 (2004).

  70. Local Lattice Parameter Determination of Strained Areas of Semiconductors Using CBED
    T.Akaogi, K.Tsuda, M.Terauchi and M.Tanaka
    Microscopy & Microanalysis, vol.10 (supple.2) (USA, 8/1-5), 310-311 (2004).

  71. Detection of Characteristic Signals from As-Doped (less than 1 at.%) Regions of Silicon by Transmission Electron Microscopy and Convergent-beam Electron Diffraction
    M.Terauchi, K.Tsuda, H.Mitsuishi and K.Kawamura
    Microscopy & Microanalysis, vol. (supple.2) (USA, 8/1-5), 338-339 (2004).

  72. PERFORMANCE OF MIRAI-21 ANALYTICAL ELECTRON MICROSCOPE
    M.Mukai, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, D.Ioanoviciu, G.Martinez, M.Naruse, T.Honda and M.Tanaka
    Microscopy & Microanalysis, vol.10 (supple.2) (USA, 8/1-5), 858-859 (2004).

  73. A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons (invited)
    M.Terauchi
    Microscopy & Microanalysis, vol.10 (supple.2) (USA, 8/1-5), 1044-1045 (2004).

    2005-2007
  74. Soft-X-ray emission spectroscopy based on TEM (invited)
    M.Terauchi
    Abstract of EDGE2005 International EELS workshop (Austria, 5/1-5), 22 (2005).

  75. Performance of a new Monochromator for a 200 kV Analytical Electron Microscope
    M.Mukai, T.Kanayama, T.Tomota, K.Tsuno, M.Terauchi, K.Tsuda, M.Naruse, T.Honda and M.Tanaka
    Abstract of EDGE2005 International EELS workshop (Austria, 5/1-5), 25 (2005).

  76. Development of wavelength-dispersive X-ray spectrometer for a conventional analytical transmission electron microscope
    M.Terauchi, M.Koike, K.Fukushima and J.Kimura
    Abstract of EDGE2005 International EELS workshop (Austria, 5/1-5), 54 (2005).

  77. High energy-resolution electron energy-loss spectroscopy study of the electronic structure of two-wall carbon nanotubes
    Y.Sato, M.Terauchi, Y.Saito and R.Saito
    Abstract of EDGE2005 International EELS workshop (Austria, 5/1-5), 135 (2005).

  78. Performance of a new Monochromator for a 200 kV Analytical Electron Microscope
    M.Mukai, T.Kanayama, T.Tomota, K.Tsuno, M.Terauchi, K. suda, M.Naruse, T.Honda and M.Tanaka
    Microscopy & Microanalysis, vol.11(supple.2) (USA, 8/1-5), 2134-2135 (2005).

  79. Ultra High-Energy-Resolution Soft-X-ray emission Spectroscopy for TEM/STEM
    Y.Murooka, Y.Ito, W.J.Fabella and M.Terauchi Microscopy & Microanalysis, late poster session (USA, 8/1-5), (2005).

  80. Structure and electronic properties of Mg-doped α- and β-rhombohedral boron
    H.Hyodo, S.Araake, K.Soga, Y.Satoh, M.Terauchi and K. Kimura
    Abstract of ISBB2005 (Humberg, 8/21-26), (2005).

  81. Nanocrystalline films of silicon carbonitride: chemical composition and bonding and functional properties
    N.I.Fainer, M.L.Kosinova, Yu.M.Rumyantsev, E.A.Maximovskii, B.M.Ayupov, B.A.Kolesov, F.A.Kuznetsov, V.G.Kesler, M.Terauchi, K.Shibata, F.Satoh and Z.X.Cao
    Proceedings of 15th European conference on chemical vapor deposition (Germany, 9/4-9), 1074-1081 (2005).

  82. Synthesis, nanoindentation and AFM studies of CVD boron carbon nitride films
    M.L.Kosinova, N.I.Fainer, V.S.Sulyaeva, Yu.M.Rumyantsev, F.A.Kuznetsov, E.A.Maximovskii, Z.Cao, M.Terauchi, K.Shibata and F.Satoh
    Proceedings of 15th European conference on chemical vapor deposition (Germany, 9/4-9), 1082-1087 (2005).

  83. Silicon and boron carbonitride films obtained by CVD methods
    N.I.Fainer, M.L.Kosinova, V.S.Sulyaeva, Yu.M.Rumyantsev, E.A.Maximovskii, B.M.Ayupov, B.A.Kolesov, F.A.Kuznetsov, V.G.Kesler, M.Terauchi, K.Shibata, F.Satoh and Z.X.Cao
    5th Israeli-Russian bi-national workshop (Novosibrisk, 7/9-14), 47-66 (2006).

  84. Microstructures of Al-Cu-Fe quasicrystalline catalysts prepared by NaOH aq. Leaching
    T.Tanabe, S.Kameoka, F.Sato, M.Terauchi and A.P.Tsai
    5th Tokyo Conf. on Advanced Catalytic Science and Technology (TOCAT5), 23-28 July 2006, Tokyo.

  85. Development of wavelength-dispersive X-ray spectrometer for a conventional analytical transmission electron microscope
    M.Terauchi, M.Koike, K.Fukushima and J.Kimura
    Microscopy & Microanalysis, vol.12(supple.2) (USA, 7/31-8/3), 866-867 (2006)

  86. Monochromator for a 200 kV Analytical Electron Microscope
    M.Mukai, W.Inami, K.Omoto, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, M.Naruse, T.Honda and M.Tanaka
    Microscopy & Microanalysis, vol.12(supple.2) (USA, 7/31-8/3), 1206-1207 (2006)

  87. Development of Wavelength-Dispersive X-ray Spectrometer for a Conventional Analytical Transmission Electron Microscope
    M.Terauchi, M.Koike, K.Fukushima and J.Kimura
    Proc. of 16th International Conference on Microscopy (Sapporo, 9/3-8), 892 (2006).

  88. Monochromator for a 200 kV Analytical Electron Microscope
    M.Mukai, W.Inami, K.Omoto, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, M.Naruse, T.Honda and M.Tanaka
    Proc. 16th International Conference on Microscopy (Sapporo, 9/3-8), 860 (2006).

  89. Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1-102) substrate using convergent-beam electron diffraction
    T.Akaogi, K.Tsuda, M.Terauchi and M.Tanaka
    Proc. 16th International Conference on Microscopy (Sapporo, 9/3-8), 1461 (2006).

  90. High energy-resolution electron energy-loss spectroscopy study of the electric structure of carbon nanotubes
    Y.Satoh, M.Terauchi, Y.Saito and R.Saito
    Proc. 16th International Conference on Microscopy (Sapporo, 9/3-8), 845 (2006).

  91. Recent advances in spectroscopy methods based on TEM
    M.Terauchi
    Proc. 10th SANKEN Int. Symp. on Nanoscience and Nanotechnology 2006 (Osaka Univ., 9/19-20), 27-28 (2006).

  92. Cross-section TEM investigation of quasicrystalline catalysts prepared by NaOH aq. Leaching
    T.Tanabe, S.Kameoka, F.Sato, M.Terauchi and A.P.Tsai
    Abstracts of Aperiodic 2006 (Zao, 9/17-22), 39 (2006).

  93. TEM-EELS study of electronic structures of quasicrystals and apprpximants
    M.Terauchi, Y.Uemichi, A.P.Tsai, T.Takeuchi and U.Mizutani
    Abstracts of Aperiodic 2006 (Zao, 9/17-22), 39 (2006).

  94. Characterization of a quasicrystalline catalyst for steam reforming of methanol
    T.Tanabe, S.Kameoka, F.Sato, M.Terauchi and A.P.Tsai
    4th Asia Pacific Congress on Catalysis (Singapore, December), A6-025 (2006).

  95. Catalytic performance and microstructure of Al-Cu-Fe quasicrystalline catalystl
    T.Tanabe, Sa.Kameoka, F.Sato, M.Terauchi and A.P.Tsai
    11th Japan-Korea Symposium on Catalysis (Seoul Korea, May), SO-2 (2007).

  96. Mg-doping experiments in boron icosahedral cluster solids
    H.Hyodo, S.Araake, K.Kirihara, K.Soga, K.Kawaguchi, Y.Shimizu, T.Sasaki, N.Koshizaki, Y.Sato, M.Terauchi and K. Kimura
    14th Int. Symposium on Intercalation Compounds (Korea, 6/12-15), (2007).

  97. Mg-doping into boron icosahedral cluster solids, targeting high temperature superconductivity
    H.Hyodo, S.Araake, K.Kirihara, K.Soga, K.Kawaguchi, Y.Shimizu, T.Sasaki, N.Koshizaki, Y.Satoh, M.Terauchi and K. Kimura
    The Doyama Symposium on Advanced Materials (Tokyo, 9/5-8), 2007.

  98. New development of a wavelength-dispersive X-ray spectrometer up to 2 keV for a conventional analytical transmission electron microscope
    M.Terauchi, Y.Yoneda and M.Koike
    Microscopy & Microanalysis, vol.13(supple.2) (USA, 8/6-8/9), 166-167 (2007).

  99. High Energy-Resolution Electron Energy-Loss Spectroscopy Study of the Electronic Structures of One-Dimensional Nano-Scale Materials
    Y.Sato, M.Terauchi, Y.Saito, K,Sato, R.Saito, J.Kikkawa and S.Takeda
    Microscopy & Microanalysis, vol.13(supple.2) (USA, 8/6-8/9), 774-775 (2007).

  100. Performance of a monochromator for a 200 kV analytical electron microscope
    M.Mukai, W.Inami, K.Omoto, T.Kaneyama, T.Tomita, K.Tsuno, M.Terauchi, K.Tsuda, Y.Satoh, M.Naruse, T.Honda and M.Tanaka
    Microscopy & Microanalysis, vol.13(supple.2) (USA, 8/6-8/9), 1242-1243 (2007).

  101. Recent development of soft-X-ray emission spectroscopy instruments for a conventional analytical transmission electron microscope (invited)
    M.Terauchi and M. Koike
    Abstract of 11th Frontiers of Electron Microscopy in Materials Science (9/24-28, UAS), 2007.

    2008-2010
  102. Quantitative Analysis of Intermetallic Compound and TEM Specimen Preparation for Sn Whiskers
    Katsuaki Suganuma and Masami Terauchi
    Proceedings of 2nd International Symposium on Tin Whiskers (4/24-25, Tokyo), 1-1-3 (2008).

  103. Total electronic structure analysis by EELS & SXES based on transmission electron microscopy (invited)
    M.Terauchi
    Proc. of the 1st Int. Symp. on Advanced Microscopy and Theoretical Calculations (6/29-30, Nagoya), 110-111 (2008).

  104. Mechanism of Formation of AlN Film by Sapphire Nitridation and Polarity Determination
    H.Fukuyama, T.Aikawa, H.Kobatake, K.Tsuda, M.Terauchi, K.Hiraga and K. Takada
    Abstract of 2nd International Symposium on Growth of III Nitrides (7/6-9, Izu), (2008).

  105. High energy-resolution EELS studies on electronic excitations of LaB6 and Cs0.33WO3 particles by using a monochromator transmission microscope
    Y.Sato, M.Terauchi, M.Tanaka, M.Mukai, T.Kaneyama, K.Adachi and T.Asahi
    Microscopy & Microanalysis, vol.14(supple.2) (USA, 8/4-7), 1356-1357 (2008).

  106. Soft-X-ray emission spectroscopy study of transition intensities from the valence band to 3d core-hole of lanthanide oxides
    M.Terauchi and Y.Yoneda
    Microscopy & Microanalysis, vol.14(supple.2) (USA, 8/4-7), 822-823 (2008).

  107. Electronic structure studies of carbon materials by high energy-resolution carbon K-emission spectroscopy measurements M.Terauchi, H.Nishihara and T.Kyotani
    Microscopy & Microanalysis, vol.14(supple.2) (USA, 8/4-7), 796-797 (2008).

  108. The system of PbZr1-xTixO3 studied by convergent-beam electron diffraction
    Roland Schierholz, Ralf Theissmann, Hartmut Fuess, Kenji Tsuda and Masami Terauchi
    Abstract of IUCr2008 (8/23-31, Osaka), Acta Cryst. A64, C145 (2008).

  109. Determination of chiral indices of carbon nanotubes using electron diffraction pattern
    Y.Sato, K.Tsuda, M.Terauchi and Y.Saito
    Abstract of IUCr2008 (8/23-31, Osaka), Acta Cryst. A64, C605-606 (2008).

  110. Structure and electronic properties of high concentration Li-doped and Mg-doped β-rhombohedral boron
    H.Hyodo, A.Nedu, S.Araake, S.Hosoi, K.Soga, Y.Sato, M.Terauchi and K.Kimura
    Abstract of ISBB2008 (9/7-12, Matsue), 46 (2008).

  111. Electron energy-loss spectroscopy and soft X-ray emission spectroscopy studies of electronic structure of boron nanobelts
    Y.Sato, M.Terauchi, Z.Wang, Y.Shimizu, T.Sasaki, K.Kawaguchi, N.Koshizaki and K.Kimura
    Abstract of ISBB2008 (9/7-12, Matsue), 107 (2008).

  112. Structure and electrical conduction of Li-doped and Mg-doped boron nanobelt
    H.Hyodo, K.Kirihara, K.Soga, K.Kawaguchi, Y.Shimizu, T.Sasaki, N.Koshizaki, Y.Sato, M.Terauchi and K.Kimura
    Abstract of ISBB2008 (9/7-12, Matsue), 117 (2008).

  113. Convergent-beam electron diffraction study of boron nanobelts
    Kenji Tsuda, Keisuke Iwasaki, Yohei Sato, Masami Terauchi and Kaoru Kimura
    Abstract of ISBB2008 (9/7-12, Matsue), 127 (2008).

  114. Soft-X-ray emission spectroscopy study of the valence electron states of α-rhombohedral boron
    Masami Terauchi, Yohei Sato1 and Kaoru Kimura
    Abstract of ISBB2008 (9/7-12, Matsue), 138 (2008).

  115. Nano-spectroscopies based on transmission electron microscopy (invited)
    Masami Terauchi
    Abstract of 4th Handai Nanoscience and Nanotechnology International Symposium (9/29-10/1, Osaka), O2-1 (2008).

  116. High energy-resolution EELS studies on plasmon excitations of LaB6 and Cs0.33WO3 particles by using a monochromator transmission electron microscope
    Y.Sato, M.Terauchi, M.Mukai, T.Kaneyama, and K.Adachi
    Abstract of 9th Asia-Pacific Microscopy Conference (11/2-7, Korea), (2008).

  117. Recent development of soft-X-ray emission spectroscopy instruments for a conventional analytical transmission electron microscope (invited)
    M.Terauchi and M.Koike
    Abstract of 9th Asia-Pacific Microscopy Conference (11/2-7, Korea), (2008).

  118. Nano-spectroscopies based on transmission electron microscopy
    M.Terauchi and Y.Sato
    France-Tohoku workshop A2008/12/12 ASendai.

  119. Study of crystal and electronic structures of boron nanobelt using convergent-beam electron diffraction and electron energy-loss spectroscopy
    K.Tsuda, D.Morikawa, K.Iwasaki, Y.Sato, M.Terauchi, K.Kirihara, K.Kawaguchi, T.Sasaki, N.Koshizaki, H.Hyodo and K.Kimura
    15th International Symposium on Intercalation Compounds (ISIC15), Satellite Meeting, 2009/5/14-15, Tsinghua University, Beijing, China.

  120. Production of high purity alpha-Rhombohedral Boron and Li-doping into it, targeting superconductivity
    T.Nagatochi, H.Hyodo, K.Soga, Y.Sato, M.Terauchi and K.Kimura
    15th International Symposium on Intercalation Compounds (ISIC15), Satellite Meeting, 2009/5/14-15, Tsinghua University, Beijing, China.

  121. Neutron Irradiation Effects on the Structure and Electrical Property of Boron Nanobelts
    K.Kirihara, Y.Sato, Y.Yamada, Y.Shimizu, T.Sasaki, N.Koshizaki, H.Yamamoto, S.Shamoto, K.Soga, H.Hyodo, M.Terauchi and K.Kimura
    15th International Symposium on Intercalation Compounds (ISIC15), Satellite Meeting, 2009/5/14-15, Tsinghua University, Beijing, China.

  122. EELS and SXES studies of electronic structures of Al-TM alloys
    S.Koshiya, M.Terauchi, A.P.Tsai, Y.Takagiwa and K.Kimura
    The 5th Asian International Workshop on Quasicrytals (AIWQ5), 2009/6/1-4, Tokyo, Japan.

  123. Catalytic performance and microstructure of Al-Cu-Fe quasicrystalline catalyst
    T.Tanabe, S.Kameoka, F.Sato, M.Terauchi and An Pang Tsai
    The 5th Asian International Workshop on Quasicrytals (AIWQ5), 2009/6/1-4, Tokyo, Japan.

  124. Development of TEM-SXES instruments for valence electron spectroscopy (Invited)
    M.Terauchi
    Microscopy & Microanalysis, vol.15(supple.2) (USA, 7/27-31), 214-215 (2009).

  125. High energy-resolution EELS studies of surface plasmon of nm-scale metal particles in near infrared region by using a monochromator TEM
    Y.Sato, M.Terauchi and K.Adachi
    Abstract of 12th Frontiers of Electron Microscopy in Materials Science (9/27-10/2, Nagasaki), P-097 (2009).

  126. EELS and SXES studies of electronic structures of Al53Si27Mn20 alloys
    S.Koshiya, M.Terauchi and A.P.Tsai
    Abstract of 12th Frontiers of Electron Microscopy in Materials Science (9/27-10/2, Nagasaki), P-099 (2009).

  127. EELS and SXES studies of electronic structures of Zn-Mg-Zr alloys
    S.Koshiya, M.Terauchi, S.Ohhashi and A.P.Tsai
    Abstract of 11th International Conference on Quasicrystals (6/14-18, Hokkaido), P04-09 (2010).

  128. A Soft X-ray Emission Spectrometer with High-energy Resolution for Electron Probe Microanalysis
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto
    Microscopy & Microanalysis, vol.16(supple.2), 34-35 (2010).

  129. Li K-emission measurements using a newly developed SXES-TEM instruments
    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto
    Microscopy & Microanalysis, vol.16(supple.2), 1308-1309 (2010).

  130. Valence electron spectroscopy by SXES-TEM (Invited)
    M.Terauchi
    6th International Workshop on Nano-Scale Spectroscopy and Nanotechnology (NSS6), 2010/10/25-29, Kobe University.

    2011-2013
  131. A Newly Developed Soft X-ray Spectrometer from Li-K Detection for Electron Probe Microanalyser and Transmission Electron Microscope
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto
    11th Australian Microbeam Analysis Society (Canberra, 7-11 Feb. 2011).

  132. Development of a new WDS system for electron microscopy
    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto
    Europian Microbeam Analysis Society 2011 (5/15-19, Ange France), 388.

  133. A Newly Developed Soft X-ray Spectrometer for Electron Probe Microanalyser
    @- An Acquisition of the Li K Emission Spectrum with High-energy Resolution and Detection of Light Elements a Few Tens of ppm -
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto
    5th International Union of Microbeam Analysis Societies (Seoul Korea, 22-27 May 2011).

  134. An Extension up to 4 KeV by a Newly Developed Multilayer-coated Grating for TEM-SXES Spectrometer
    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto
    Microscopy & Microanalysis, vol.17(supple.2), 604-605 (2011).

  135. A Newly Developed Grating and Soft X-ray Spectrometer for Electron Probe Microanalyser and Transmission Electron Microscope
    @- An Acquisition of the Li K Emission Spectrum with High-energy Resolution and Detection of Light Elements -
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Microscopy & Microanalysis, LB001 (2011).

  136. High Energy-Resolution EELS and SXES Studies on Characteristic Chemical Shifts and Charge Transfer in Al-Si-Mn and Zn-Mg-Zr Alloys
    S.Koshiya, M.Terauchi and A.P.Tsai
    Microscopy & Microanalysis, vol.17(supple.2), 1184-1185 (2011).

  137. Superconductivity in Li-doped α-Rhombohedral Boron
    H.Hyodo, T.Nagatochi, A.Sumiyoshi, K.Soga, Y.Sasto, M.Terauchi, F.Esaka and K.Kimura
    17th International Symposium on Boron, Borides and Related Materials (ISBB-2011), 9/11-17 Istanbul Turkey (2011).

  138. A multilayer grating with a novel layer structure for a flat-field spectrograph attached to transmission electron microscopes in energy region of 2-4 keV
    T. Imazono, M. Koike, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto, M. Terauchi, H. Takahashi, N. Handa, and T. Murano
    21st Int. Congress on X-ray Optics and Microanalysis (ICXOM21), Campinas, Brazil, September 5-8, 2011.

  139. TEM / EELS studies of polyynes inside SWCNT
    Md. Mahbubul Haque, Yohei Sato, Masami Terauchi, Tomonari Wakabayashi
    Workshop on Carbon Nanotube in Commemoration of the 20th Anniversary of its @Discovery ("2011-CNT20"), December 12-13, 2011, Tokyo.

  140. Capability of Chemical State Analysis of K Emission from Li to F and L Emission from Mg to P and race Light Element Analysis
    using Newly Developed High Energy Resolution Ultra-Soft X-ray Emission Spectrometer attached to Electron Probe Microanalyser
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    10th Asia-Pacific Microscopy Conference (APMC-10 2012), February 5 - 9, 2012, Perth, Australia.

  141. TEM studies on crystal and electronic structures of Quasicrystals (invited)
    M.Terauchi,
    The 30 years of Quasicrystal International Conference at Taipei Tech, May 7-9, 2012, Taipei Taiwan.

  142. Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM
    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto
    Microscopy & Microanalysis, vol.18(supple.2), 938-939 (2012).
    ,
  143. High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA
    T.Murano, H.Takahashi, N.Handa, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Microscopy & Microanalysis, vol.18(supple.2), 776-777 (2012).

  144. A multilayer grating with a novel layer structure for a flat-field spectrograph attached to transmission electron microscopes in energy region of 2-4 keV
    T.Imazono, M.Koike, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto, M.Terauchi, H. Takahashi, N. Handa and T. Murano
    AIP Conf. Proc., vol.1437, 24-28 (2012).

  145. Development of a soft x-ray diffractometer for a wideband multilayer grating with a novel layer structure in the 2-4 keV range
    T.Imazono, M.Koike, T.Kawachi, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto, M.Terauchi,H.Takahashi, N.Handa, and T.Murano
    AIP Conf. Proc., vol.1465, 33-37 (2012).

  146. Electron spectroscopic study of electronic structure of MgB4
    Taiki Saito, Yohei Sato, Masami Terauchi, Hiroki Saito, and Masatoshi Takeda
    Abstract of 17th International Symposium on Intercalation Compounds, PI-22(Poster), 2013/5/13, Sendai.

  147. TEM-SXES study of electronic structure of metal-B6 materials
    Masami Terauchi, Taiki Saito, Yohei Saito, Kaori Inayoshi, and Masatoshi Takeda
    Abstract of 17th International Symposium on Intercalation Compounds, PI-23(Poster), 2013/5/13, Sendai.

  148. High energy-resolution EELS and SXES studies of characteristic chemical shifts of AlReSi approximant alloys
    Shogo Koshiya, Masami Terauchi, Yoshiki Takagiwa, Kohei Yamada, Ikuzo Kanazawa, and Kaoru Kimura
    Abstract of 17th International Symposium on Intercalation Compounds, PI-37(Poster), 2013/5/13, Sendai.

  149. The creation of alkali metal hexagonal boron nitride intercalation compounds
    Atsuro Sumiyoshi, Hroshi Hyodo, Yohei Sato, Masami Terauchi, and Kaoru Kimura
    Abstract of 17th International Symposium on Intercalation Compounds, K-2(Oral) 2013/5/13, Sendai.

  150. New wavelength dispersive soft X-ray emission spectrometer for high energy resolution X-ray spectrometry under 0.5 eV and chemical state mapping in EPMA
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Europian Microbeam Analysis Society 2013 (Porto Portugal, 5/12-16)

  151. Recent developments of soft-X-ray emission spectroscopy instruments and those applications
    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M. Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Enhanced Data Generated by Electrons 2013 (oral), 28 May 2013, Sainte Maxime, France.

  152. High energy-resolution EELS and SXES studies of characteristic chemical shifts of AlReSi approximant alloys
    S.Koshiya, M.Terauchi, Y.Takagiwa, K.Yamada, I.Kanazawa, and K.Kimura
    Enhanced Data Generated by Electrons 2013 (poster), 28 May 2013, Sainte Maxime, France.

  153. Electron spectroscopic study of electronic structure of MgB4
    T.Saito, Y.Sato, M.Terauchi, H.Saito, and M.Takeda
    Enhanced Data Generated by Electrons 2013 (poster), 28 May 2013, Sainte Maxime, France.

  154. High energy-resolution EELS study of interband transitions Eii characteristic to single-walled carbon nanotubes
    Y.Sato and M.Terauchi
    Enhanced Data Generated by Electrons 2013 (poster), 29 May 2013, Sainte Maxime, France. (Poster prize)

  155. Chemical State Mapping via soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Microscopy & Microanalysis vol.19(Suppl.2), 1258-1259 (2013).

  156. Construction of a SXES spectrometer for a conventional SEM
    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M. Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Microscopy & Microanalysis vol.19(Suppl.2), 1278-1279 (2013).

  157. Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV
    T.Imazono, M.Koike, T.Kawachi, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto, M.Terauchi, H.Takahashi, N.Handa, and T.Murano
    Proc. of SPIE, 8848, 884812-1-14 (2013).

    2014-2016
  158. Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials (Invited)
    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M. Koike, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Microscopy & Microanalysis, vol.20(Supple.3), 682-683 (2014).

  159. Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM
    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T. Imazono, N. Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa and S.Kuramoto
    Microscopy & Microanalysis, vol.20(Supple.3), 684-685 (2014).

  160. Valence Electron States of Carbon Materials studied by TEM-SXES (Invited)
    M.Terauchi
    Microscopy & Microanalysis, vol.20(supple.3), 896-897 (2014).

  161. The creation of alkali metal hexagonal boron nitride intercalation compounds
    H.Hyodo, A.Sumiyoshi, Y.Sato, M.Terauchi and K.Kimura
    ISBB2014, 8/31-9/5, Hawai (2014).

  162. TEM-EELS/SXES studies on electronic structures of p-type CaB6
    M.Terauchi, T.Saito, Y.Sato, K.Inayoshi and M.Takeda
    IMC2014, IT-5-P-2963, 9/7-12, Prague (2014).

  163. Valence Electron States of Carbon Materials studied by TEM-SXES
    M.Terauchi
    IMC2014, IT-5-P-2969, 9/7-12, Prague (2014).

  164. Spatial distribution of different diamond phases in compressed graphite studied by STEM-EELS
    Y.Sato, M.Bugnet, M.Terauchi, G.Botton and A.Yoshiasa
    IMC2014, MS-7-O-2931, 9/7-12, Prague (2014).

  165. Soft X-ray Emission Spectrometry from Lithium to Uranium with Higher Energy Resolution and Detectability
    H.Takahashi, T.Murano, M.Takakura, M.Terauchi, C.Dickinson, V.Lozbin
    13th Australian Microbeam Analysis Symposium, 2/11-13, Univ.Tasmania, Australia (2015).

  166. Chemical States Analysis of Trace-boron by using an Improved SEM-SXES
    M.Terauchi, H.Takahashi, M.Takakura, T.Murano, M.Koike, T.Imazono, T.Nagano, H.Sasai and M.Koeda
    Microscopy & Microanalysis, vol.22(supple.3), 414-415 (2016).

  167. Low Voltage Soft X-ray Emission Analysis from 100 V for Depth Chemical Information from a few nm to several hundred nm
    H.Takahashi, S.Asahina, Y.Yamamoto, Y.Sakuda, T.Kanazawa, M.Terauchi, V.Robertson, P.McSwiggen, C.Dickinson
    Microscopy & Microanalysis, vol.22(supple.3), 422-423 (2016).

  168. Direct Evaluation about Structure and Optical Property of Individual Multi-Shell Quantum Dot by TEM
    M.Uehra, Y.Sato, M.Terauchi
    Pacific Rim Meeting on electrochemical and solid-state science 2016, 2016/10/5, Hawaii, Poster 4141 (2016).

  169. Possibility of material fs function imaging microscopy for bulk specimens (Invieted)
    M.Terauchi
    Microscopy, vol.65(supple.1), i5 (2016).

    2017-2019
  170. Parallel WDS Detection using newly developed grating JS2000 from few hundred to 2300 eV with high energy resolution
    H.Takahashi, T.Murano, M.Takakura, S.Asahina, Y.Konyuba, M.Terauchi, C. Dickinson
    EMAS/IUMAS 2017, Konstantz(Germany), 458-459 (2017).

  171. Information observed in Ti-Lα,β and Ti-Ll,η emission lines of Ti and its oxides
    M.Terauchi, S.Koshiya and K.Kimoto
    EMAS/IUMAS 2017, Konstantz(Germany), 460-461 (2017).

  172. TEM-EELS study on photo luminescent multi-shell nanoparticles
    Y.Sato, N.Nakahigashi, M.Uehara, M.Terauchi
    EDGE 2017, Okinawa(Japan), P091 (2017).

  173. SXES study of electronic structure of sodium borosilicide Na8B74.5Si17.5
    M.Terauchi, H.Morito, H.Yamane, S.Koshiya, K.Kimoto
    EDGE 2017, Okinawa(Japan), T11 (2017).

  174. Carrier electron behavior of Cs doped WO3 in NIR region studied by momentum transfer resolved EELS
    Y.Sato, M.Terauchi, K.Adachi
    EDGE 2017, Okinawa(Japan), T37 (2017).

  175. Enhancement of diffraction efficiency and spectral flux of laminar-type diffraction gratings coated with Ni/La/C layers in soft X-ray region
    T.Hatano, M.Koike, H.Nishihara, A.S.Pirozhkov, M.Terauchi, H.Sasai, T.Nagano
    13th Int. Conf. on Synchrotron Radiation Instrumentation SRI2018, Taiwan, PD2-01 (2018).

  176. Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES
    M.Terauchi, Y.Sato, M.Takeda, T.Hatano, M.Koike, H.Sasai, T.Nagano, M.Koeda, T. Murano and H. Takahashi
    Microscopy & Microanalysis, Baltimore MD (USA), vol.24(suppl.1), 746-747 (2018).

  177. Momentum transfer resolved EELS study of anisotropic carrier plasmon in Cs0.33WO3
    Y.Sato, M.Terauchi, K.Adachi
    19th International Microscopy Congress (IMC19), 717 (2018).

  178. Soft X-ray emission spectroscopy for chemical state analysis
    M.Terauchi and Y.Sato
    Extended Abstracts of AMAS XV, 22-23 (2019).

  179. Recent Progresses in Soft X-ray Emission Spectroscopy
    M.Terauchi, T.Hatano, M.Koike, A.S.Pirozhkov, H.Sasai, T.Nagano, M.Takakura and T.Murano
    Abstracts of EMAS 2019, 241-253 (2019).

  180. Design of soft X-ray high diffraction efficiency diffraction gratings with hybrid multilayer coatings in and energy range of 200-900 eV
    M.Koike, T. Hatano, A.S.Pirozhkov, M.Terauchi, N.Hayashi, and T.Nagano
    Vacuum Ultraviolet and X-ray Physics (VUVX19), Poster 2-18 (2019).

  181. Information of valence charge of 3d transition metal elements observed in L-emission spectra
    M.Terauchi
    Microscopy and Microanalysis, vol.25(Suppl 2) 248-249.

  182. Chemical State Mapping of Amorphous Carbon Films by Soft X-ray Emission Spectroscopy
    M.Terauchi and Y.Sato
    Microscopy and Microanalysis, vol.25(Suppl 2) 1754-1755.

  183. Functional imaging of p/n-controlled CaB6 and SrB6 bulk specimens by soft X-ray emission spectroscopy microscope
    M.Terauchi, Y.Sato and M.Takeda
    Abstracts of 20th International Symposium on Boron, Borides and Related Materials, 36 (2019).

  184. Electronic structure of MgB4 studied by EELS and SXES
    Y.Sato, T.Saito, K.Tsuchiya, M.Terauchi, H.Saito and M.Takeda
    Abstracts of 20th International Symposium on Boron, Borides and Related Materials, 81 (2019).

  185. Carrier plasmon of LaB6 studied by momentum transfer resolved EELS
    Y.Sato, J.Kamoi, and M.Terauchi
    Abstracts of 20th International Symposium on Boron, Borides and Related Materials, 82 (2019).

  186. Synthesis, Crystal Structure and Properties of Lithium-Ion conducting LiTa2PO8
    N.Ishigaki, K.Kataoka, D.Morikawa, M.Terauchi, K.Hayamizu, and J.Akimoto
    Abstract of International Japan-Korea Seminar on Ceramics, B-03 (2019).

  187. Anisotropic Dielectric Properties of Cs-doped Tungsten Oxide Nanoparticles Studied by Electron Energy-loss Spectroscopy
    K.Machida, K.Adachi, Y.Sato, and M.Terauchi
    Abstract of MRS 2019, EN15.03.07 (2019).

    2020-2022
  188. Imaging of p/n-type regions in a bulk CaB6 specimen by soft X-ray emission spectroscopy
    M.Terauchi, Y.K.Sato and M.Takeda
    Abstract of IMRAM-Melbourne University online WS, 7 (2020).

  189. Materials Analysis by using Electron Microscopes operated in IMRAM
    M.Terauchi, H.Jinnai, Y.K.Sato, D.Morikawa, K.Tsuda, and Z.Akase
    Abstract of 2020 ONLINE JOINT SYMPOSIUM Engineer a Better Tomorrow Institute of Multidisciplinary Research for Advance Material & College of Engineering, 5 (2020).

  190. Improvement of accuracy and precision in refinement of crystal structure factors using zone-axis incidence and tilted CBED patters
    B.Aryal, D.Morikawa, K.Tsuda, and M.Terauchi
    Abstract of APS March Meeting, X60.00008 (2021).

  191. Chemical State Mapping of Amorphous Carbon and Amorphous Carbon Nitride Thin Films via Soft X-ray and Synchrotron Radiation Infrared Rays
    M.Aono, M.Shimono, H.Kishimura, Y.K.Sato and M.Terauchi
    Abstract of 14th International conference on New Diamond and Nano Carbons 2020/2021, II-05-4.

  192. Fine structures of Fe L-emission examined by a new HR-SXES instrument
    M.Terauchi, R.Ebisu, Y.K.Sato and M.Koike
    Microscopy and Microanalysis, vol.27(suppl 1) 1370-1371 (2021), 10.1017/S1431927621005109

  193. Improvement of precision and sensitivity in refinement of crystal structure factors using zone-axis and Bragg-excited CBED patters
    B.Aryal, D.Morikawa, K.Tsuda, and M.Terauchi
    Abstract of IUCr 2021, MS-3 223-4.

  194. Charge orbital ordering in A-site ordered NdBaMn2O6 perovskite
    Md S.Islam, D.Morikawa, S.Yamada, K.Tsuda, and M.Terauchi
    APS March meeting, Session T31, 2022/3/17.

  195. Electronic structure of Mg-Zn-Y cluster in dilute Mg alloys studied by STEM-EELS
    Y.K. Sato, D.Egusa, H.Miyazaki, K.Kimura, M.Itakura, M.Terauchi, E.Abe
    Abstract of the 5th International Symposium on Long-Period Stacking/Order Structure and Miile-feuille Structure (LPSO/MFS2022), p.100, 2022/12/14.

    2023-2026
  196. Improving the precision of electron density analysis using convergent-beam electron diffraction and its application to the ferroelectric phase transition
    B.Aryal, D.Morikawa, K.Tsuda, and M.Terauchi
    27th Australian Conf. on Microscopy & Microanalysis, 2023/1/31, Perth WA

  197. The Current Development Status of Electron Beam Induced Soft X-ray Emission Spectrometer
    S.Koshiya, T.Murano, M.Takakura, Y.Kato, H.Takahashi, M.Koike, K.Kondo, T.Hatano, and M.Terauchi
    EMAS 2023, 2023/5/8, Poland.

  198. Observation of temperature-induced piezomagnetic switching in Cu2OSeO3 polymorph synthesized under high-pressure
    H.C.Wu, T.Aoyama, D.Morikawa, D.Okuyama, K.Nawa, W.T.Chen, C.H.Lu, T.W.Yen, S.M.Huang, S.Calder, S.Torii, K.Ohgushi, M.Terauchi, and T.J.Sato
    International Conference on Quantum Liquid Crystals, 2023/8/9, Sapporo.

  199. Crystal structure study of (Sr1-xBax)2Nb2O7 using electron diffraction
    B.Aryal, D.Morikawa, K.Tsuda, S.Tsukasa, Y.Akishige, and M.Terauchi
    IUCR 2023, 2023/8/26, Melbourne.

  200. Compressed graphite and its electronic structure investigated by TEM-EELS
    K.Niwase, Y.Ohsawa, Y.K.Sato, T.Saito, M.Terauchi, T.kitazume, T.Tokunaga, Y.Higo, M.Niibe and S.Honda
    33rd International conference on diamond and carbon materials, 2023/9/10-14, Spain.

  201. Momentum resolved STEM-EELS analysis of the solute clusters in dilute Mg-Zn-Y alloy
    Y.K.Sato, D.Egusa, H.Miyazaki, K.Kimura, M.Itakura, M.Terauchi, and E.Abe
    IMC20, 2023/9/11, Korea.

  202. Angle-resolved SXES study on anisotropic electronic structure of NaAlSi
    Y.K.Sato, R.Ebisu, M.Terauchi, and T.Yamada
    IMC20, 2023/9/13, Korea.

  203. Examining of the anisotropic behavior of excitons in anatase TiO2 by angle-resolved EELS
    T.Saito, Y.K.Sato, and M.Terauchi
    IMC20, 2023/9/14, Korea.

  204. Chemical bonding study of KNbO3 and KTaO3 using QCBED
    B.Aryal, P.N.H.Nakashima, L.Bourgeois, D.Morikawa, K.Tsuda, and M.Terauchi
    IMC20, 2023/9/14, Korea.

  205. Enhancement of Diffraction Efficiency and Spectral Flux with Quasi-Graded Index Coating (QGIC) on Soft X-Ray Laminar-Type Diffraction Gratings Optimized for B-K and Li-K Emissions
    M.Koike, T.Hatano, A.S. Pirozkov, and M.Terauchi
    PXRNMS 2023, 2023/10/11, Himeji.

  206. Electron Spectroscopy Studies of Anisotropic Electronic Structure of Materials
    M.Terauchi, K.Machida, Y.Hada, Y.K.Sato, and M.Takeda
    The 3rd Joint USTB-TU Symposium, 2023/11/13, Beijin.

  207. The evaluation of exciton size by angle-resolved EELS and the role of exciton size in photocatalytic function
    T.Saito, Y.K.Sato, M.Terauchi, T.Omata, I.Suzuki, J.Kikkawa
    EDGE2024, Poster, 2024/6/10, Canada.

  208. Acoustic oscillations on piezoelectric materials excited by a GHz pulsed electron beam
    Y.Sato, K.Tsuda, S.Reisbick, D.Morikawa, M.Terauchi, and Y.Zhu
    Microscopy and Microanalysis, vol.30(Suppl 1), 2024, 1447-1448.

  209. Li emission spectra obtained using a new diffraction grating with enhanced diffraction efficiency and widen energy range
    T.Murano, S.Koshiya, M.Takakura, K.Tsuji, K.Kondo, M.Koike, M.Terauchi
    Microscopy and Microanalysis, vol.30(Suppl 1), 2024, 226-228.

  210. ENHANCEMENT OF DIFFRACTION EFFICIENCY AND SPECTRAL FLUX WITH UASI-GRADED INDEX COATING (QGIC) ON SOFT X-RAY LAMINAR-TYPEDIFFRACTION GRATINGS OPTIMIZED FOR B-K AND Li-K EMISSIONS
    M.Koike, T.Hatano, A.S.Pirozhkov, T.Murano, Y.Oue, S.Koshiya, T.Kakio, M.Terauchi
    7th QST International Symposium, Poster 094, 2024/7/24, Gunma.

  211. Vacuum ultra violet emission spectra observed by newly designed grating with improved diffraction efficiency
    T.Murano, S.Koshiya, M.Takakura, M.Koike, M.Terauchi
    EMC2024, Poster 1220, 2024/8/27, Denmark.

  212. Effects of amorphous structure inhomogeneity of nanoscale to microscale on photoinduced deformation of amorphous carbon nitride thin films
    M.Aono, H.Kishimura, K.Komatsu, Y.Yamamoto, Y.K.Sato, and M.Terauchi
    ICDCM2024, P9.26, 2024/9/3, Germany.

  213. Crystal structure and chemical bonding studies using convergent-beam electron diffraction (invited)
    B.Aryal, D.Morikawa, K.Tsuda, M.Terauchi, L.Bourgeois, and P.N.Nakashima
    Materials Oceania, 2024/9/25, Thailand

  214. Design of Soft X-Ray Flat-Field Grating Spectrometer Equipped with a Laminar-Type Sherical Gratings having a High-Groove-Density Varied-Line-Spacing (VLS) Grooves that Achieves High Resolution and Graded-Refractive-Index (GRI) Multilayer Coating that Exhibits High Diffraction Efficiency in the 2-4 keV Region
    M.Koike, T.Hatano, A.S.Pirozhkov, T.Murano, Y.Oue, S.Koshiya, T.Kakio, M.Terauchi
    8th QST Int. Symposium, 2024/11/14-15, Aomori.

Top