last update : May 8, 2005
Year | Authors | Title | Journal | Vol., Page | Link |
1993 -3 |
S.Chichibu, A.Iwai, Y.Nakahara, S.Matsumoto, H.Higuchi, L.Wei and S.Tanigawa | Monoenergetic positron beam study of Si-doped GaAs
epilayers grown
by low-pressure metalorganic chemical vapor deposition using tertiarybutylarsine |
Journal of Applied Physics |
73, pp.3880-3885 | JAP (pdf) |
1993 -2 |
N.Yoshida, S.Chichibu, T.Akane, M.Totsuka, H.Uji, S.Matsumoto and H.Higuchi | Surface passivation of GaAs using ArF excimer laser in a H2S gas ambient | Applied Physics Letters |
63, pp.3035-3037 | APL (pdf) |
1993 -1 |
J.Ogata, A.Iwai, S.Chichibu, and S.Matsumoto | EL2 Out-Diffusion in Thermally Annealed Liquid-Encapsulated Czochralski GaAs |
Japanese Journal of Applied Physics | 32, pp.5059-5061 | JJAP (pdf) |
1992 | S.Chichibu, A.Iwai, S.Matsumoto and H.Higuchi | Heavily Si-doped GaAs grown by low-pressure metalorganic chemical vapor deposition using tertiarybutylarsine and silane |
Applied Physics Letters | 60, pp.489-491 | APL (pdf) |
1990 | S.Chichibu, M.Kushibe, K.Eguchi, M.Funemizu and Y.Ohba | High concentration Zn doping in InP grown by low-pressure metalorganic chemical vapor deposition |
Journal of Applied Physics |
68, pp.859-861 | JAP (pdf) |
1989 | S.Chichibu, N.Ohkubo and S.Matsumoto | Role of Electron Traps on the Thermal Conversion and Its Suppression for Liquid-Encapsulated Czochralski GaAs Single Crystals |
Japanese Journal of Applied Physics | 28, pp.1750-1755 | JJAP (pdf) |
1988 -2 |
N.Ohkubo, S.Chichibu and S.Matsumoto | Effect of carbon concentration on the thermal conversion of liquid-encapsulated Czochralski semi-insulating GaAs |
Applied Physics Letters |
53, pp.1054-1055 | APL (pdf) |
1988 -1 |
S.Chichibu, N.Ohkubo and S.Matsumoto | Effects of controlled As pessure annealing on deep levels of liquid encapsulated Czochralski GaAs single cryatals |
Journal of Applied Physics |
64, pp.3987-3993 | JAP (pdf) |
1987 | S.Chichibu, S.Matsumoto and T.Obokata | Effect of carbon concentration on the electrical properties of liquid-encapsulated Czochralski semi-insulating GaAs |
Journal of Applied Physics | 62, pp.4316-4318 | JAP (pdf) |
4. M.Totsuka, N.Yoshida, S.Chichibu, T.Akane, H.Uji, H.Higuchi, and S.Matsumoto: "Dry Sulfur Passivation of GaAs Surface Using ArF Excimer Laser with H2S", Extended Abstracts of 1993 International Conference on Solid State Devices and Materials, Tsukuba, Japan, 1993,p.739.3. S.Chichibu, A.Iwai, S.Matsumoto, H.Higuchi, L.Wei and S.Tanigawa: "Monoenergetic Positron Beam Study of Heavily Si-Doped GaAs Grown by MOCVD Using Tertiarybutylarsine", 5th International Conference on Shallow Impurities in Semiconductors, Physics and Control of Impurities. Kobe, Japan August 5-8 1992: Materials Science Forum 117-118,pp.315-320(1993).
2. S.Chichibu, N.Ohkubo and S.Matsumoto: "EL2 Deep Level Distribution Under Controlled
As Pressure Annealing of LEC GaAs", 5th Conference on Semi-Insulating III-V Materials. Malmo, Sweden, June 1-3 1988. (Adam Hilger,Bristol and Philadelphia, 1988), Chap.1, p.25.
1. S.Chichibu and S.Matsumoto: "The Effect of As Pressure Controlled Annealing on Deep
Levels of LEC GaAs Crystals", 172nd Meeting of The Electrochemical Society,Inc.
Honoruru,Hawaii Oct 18-23 1987: Journal of Electrochemical Society 134,p.576C(1987).