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計測センター講演会6/15,6/23のご案内

[ ご案内 ] 計測センター講演会6/15,6/23

下記の内容で、電子顕微鏡を使った材料研究に
に関する講演会を開催します。是非、ご参集ください。

1.6月15日(月)、13:30-14:00、多元研 事務棟2階 大会議室
題目:Properties of low-dimensional electron-beam-sensitive objects
obtained by aberration-corrected TEM
講師:Prof.Ute Kaiser (Ulm University)


We report on low-dimensional electron-beam-sensitive crystalline
and amorphous objects obtained by analytical low-voltage
aberration-corrected TEM following three main strategies.
(1) Improving imaging theory
(2) Sample preparation for radiation-sensitive low-dimensional objects
(3) Low-voltage TEM of 20-80kV

 

2.6月23日(火)、13:30-14:00、多元研 事務棟2階 大会議室
題目:Transmission Electron Microscopy of Interface Phenomena
in Functional Nanomaterials
講師:Prof.Wolfgang Jaeger(Christian-Albrechts-University of Kiel)


High-resolution imaging and spectroscopic techniques of advanced TEM
play a crucial role in characterizing the structure-property
relationships of inorganic functional materials and interfaces.
(1) Quantitative analyses of growth and interface phenomena for a
(PbS)1.14NbS2 chalcogenide misfit compound.
(2) Growth and doping phenomena of ZnO and In2O3 semiconductor nanowires
and melting phenomena of metallic cores in ZnO nanotubes.
(3) Applications for fabricating multi-junction III-V semiconductor
solar cells on Ge cells and on Si cells.

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