西原研究室 Nishihara Lab

menu

Facilities

Synthesis
Horizontal gold furnace (2 units)

     

Vertical gold furnace (2 units)

     

Rotary kiln

High temperature oven up to 1800℃

Hot-pressing device

Muffle furnace

Vacuum glove box (3 units)

           

Sputtering system

O2 plasma processing unit

Microwave synthesis reactor

Unidirectional freezing system

Freeze drying system

3D scanner

3D printer

TOP


Analysis
Transmission electron microscope (TEM)

X-ray photoelectron spectrometer (XPS)

X-ray diffractometer (XRD)

Gas/vapor adsorption measurement device (2 units)

     

Gas adsorption measurement device

Thermogravimeter-Differential scanning calorimetry-Mass spectrometry (TG-DSC-MS)

Thermogravimeter-Differential thermal analyzer (TG-DTA) (2units)

     

Temperature programmed desorption-Gas chromatography (TPD-GC)

Vacuum temperature programmed desorption (TPD) up to 1800℃

Ultraviolet/visible spectrometer (UV/vis)

Fluorescence spectrophotometer

In-situ diffusion reflectance Fourier transform infrared spectrometer (FT-IR)

Laser zeta potential analyzer

Particle size analyzer

Micro calorimeter

Atomic force microscope (AFM)

Digital microscope

TOP


Performance
Electrochemical measurement system

     

Battery charge/discharge device

     

High pressure gas adsorption analyzer

Testing machine

           

Gas chromatography (GC)

High performance liquid chromatography (HPLC)

Frequently used common facilities
Field emission-scanning electron microscope (FE-SEM)
Nuclear magnetic resonance (NMR)
Matrix-assisted laser desorption/ionization-time of flight-mass spectrometer (MALDI-TOF/MS)
Time of flight-secondary ion mass spectrometry(TOF-SIMS)
Elemental analyzer
Inductively Coupled Plasma-Atomic Emission Spectrometry (ICP-AES)
X-ray diffractometer (XRD); RIGAKU, SmartLab
Microscopic Raman spectroscopy
Ultra-high resolution aberration-corrected transmission electron microscope (TEM)
Super computer

TOP