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Central Analytical Facility

Central Analytical Facility in Institute of Multidisciplinary Research for Advanced Materials (Designated as Tagen CAF) was established in 2010, by combining Common Analytical Facility, which supported the analysis and characterizaition of various materials using special equipments, such as the electron microscope, X-ray diffraction devices, nuclear magnetic resonance analyzer, laser spectroscopy devices, etc., and Nanotechnical Laboratory, which supported the researches in Hybrid Nano-Materials Research Center on nanotechnology using the latest special devices. Tagen CAF is supporting the researches on the development of various materials using advanced analytical apparatuses.

A: Apparatuses for ultimate analyses

  • Elemental analyzer (C-H-N-O analyzer, O-N analyzer, C-S analyzer)
  • Inductively coupled plasma emission spectrophotometer (ICP-AES)
  • Electro probe micro analyzer (EPMA)
  • Multi functional material analyzer (X-ray photoelectron spectrometer: XPS)
  • ESCA-3400
  • Time of Flight secondary ion mass spectrometer (TOF-SIMS)
  • Glow discharge mass spectrometer

B: Apparatuses for Molecular structure analyses

  • NMR 400/600 MHz
  • Digital NMR (Liquid NMR Spectrometer)
  • Nano device ion dynamics analyzer (Solid-state NMR Spectrometer)
  • The time and space resolution precision state analysis system (Laser Raman)
  • Super-high-speed reaction analysis system (Laser flash spectrometer)
  • Pulse EPR

C: Apparatuses for Crystal Structure and Microstructure analyses

  • Transmission electron microscope (TEM)
  • Scanning electron microscope (SEM)
  • Field emission type electron microscope (FE-SEM)
  • High resolution field emission type electron microscope (High resolution FE-SEM)
  • Environmental Scanning Electron Microscope (E-SEM)
  • Nano area analysis device
  • Atomic Force Microscope (AFM)
  • Automatic Powder X-ray diffraction devices (XRD)
  • X-ray diffraction devices
  • Single-crystal automatic X-rays structure analyzer
  • Three-dimensional micro stress analyzer
  • Fluorescence X-rays analyzer (XRF)
  • Laue photograph device
  • Laser desorption ionization mass spectrometer
  • Ion trap mass spectrometer
  • High-resolution Fourier transform infrared spectrophotometer (FT-IR)
  • Thermogravimetry-Differential thermoanalysis/mass spectrometry simultaneous measurement device (TG-DTA/MASS)
  • Thermal analysis devices
  • Autograph
  • UV-Vis spectrophotometer
  • Laser diffraction particle size analyzer

D: Base facilities

  • Liquid nitrogen supply system
  • Helium gas recovery device
  • Zone melting type single crystal growth device
  • Arc smelting furnace
  • Electron beam drawing device
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